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Invited speaker C. Colbourn

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workshop accepted: see you in Chicago

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IWCT 2016 – Program


Invited speaker 9.00 - 10.00

Charles J. Colbourn: Coverage, Location, Detection, and Measurement

Coffee break 10.00 - 10.30

Session 1: Fault localization: 10.30 11.15

  1. Jaganmohan Chandrasekaran, Laleh Sh. Ghandehari, Yu Lei, Raghu Kacker and Richard Kuhn
    Evaluating the Effectiveness of BEN in Locating Different Types of Software Fault
  2. Chiya Xu, Yuanchao Qi, Ziyuan Wang and Weifeng Zhang
    Analyzing Minimal Failure-Causing Schemas in Siemens Suite (short - 15 min)

Session 2: Test Generation: 11.15 - 12.00

  1. Sergiy Vilkomir and Galen Pennell
    Should We Care about “Don’t Care” Testing Inputs? Empirical Investigation of Pair-Wise Testing
  2. Gulsen Demiroz and Cemal Yilmaz
    Towards Automatic Cost Model Discovery for Combinatorial Interaction Testing (short, 15 min)

Launch 12.00 - 13.30

Session 3: Modeling and integration with the test process: 13.30 - 15.00

  1. Anwar Sherif
    Combinatorial Testing Implementations in Solutions Testing
  2. George Sherwood
    Embedded Functions for Constraints and Variable Strength in Combinatorial Testing
  3. Peter M. Kruse
    Test Oracles and Test Script Generation in Combinatorial Testing

Session 4: Applications: 15.00 - 15.30

  1. Rick Kuhn, Vincent Hu, David Ferraiolo, Raghu Kacker and Yu Lei
    Pseudo-exhaustive Testing of Attribute Based Access Control Rules

Coffee break 15.30 - 16.00

Session 5: Applications: 16.00 -17.00

  1. Lydie Du Bousquet, Mickaël Delahaye and Catherine Oriat
    Applying a pairwise coverage criteria to scenario-based testing
  2. Koji Tsumura, Hironori Washizaki, Yoshiaki Fukazawa, Keishi Oshima and Ryota Mibe
    Pairwise Coverage-based Testing with Selected Elements in a Query for Database Applications