IWCT 2016 – Program
Welcome
Invited speaker 9.00 - 10.00
Charles J. Colbourn: Coverage, Location, Detection, and Measurement
Coffee break 10.00 - 10.30
Session 1: Fault localization: 10.30 11.15
- Jaganmohan Chandrasekaran, Laleh Sh. Ghandehari, Yu Lei, Raghu Kacker and Richard Kuhn
Evaluating the Effectiveness of BEN in Locating Different Types of Software Fault
[slides] - Chiya Xu, Yuanchao Qi, Ziyuan Wang and Weifeng Zhang
Analyzing Minimal Failure-Causing Schemas in Siemens Suite (short - 15 min)
Session 2: Test Generation: 11.15 - 12.00
- Sergiy Vilkomir and Galen Pennell
Should We Care about “Don’t Care” Testing Inputs? Empirical Investigation of Pair-Wise Testing
[slides] - Gulsen Demiroz and Cemal Yilmaz
Towards Automatic Cost Model Discovery for Combinatorial Interaction Testing (short, 15 min)
[slides]
Launch 12.00 - 13.30
Session 3: Modeling and integration with the test process: 13.30 - 15.00
- Anwar Sherif
Combinatorial Testing Implementations in Solutions Testing - George Sherwood
Embedded Functions for Constraints and Variable Strength in Combinatorial Testing
[slides] - Peter M. Kruse
Test Oracles and Test Script Generation in Combinatorial Testing
[slides]
Session 4: Applications: 15.00 - 15.30
- Rick Kuhn, Vincent Hu, David Ferraiolo, Raghu Kacker and Yu Lei
Pseudo-exhaustive Testing of Attribute Based Access Control Rules
Coffee break 15.30 - 16.00
Session 5: Applications: 16.00 -17.00
- Lydie Du Bousquet, Mickaël Delahaye and Catherine Oriat
Applying a pairwise coverage criteria to scenario-based testing
[slides] - Koji Tsumura, Hironori Washizaki, Yoshiaki Fukazawa, Keishi Oshima and Ryota Mibe
Pairwise Coverage-based Testing with Selected Elements in a Query for Database Applications
[slides]